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Proceedings Paper

Scanning pyroelectric microscopy for characterizing large-area printed ferroelectric sensors on the nanoscale
Author(s): Barbara Stadlober; Jonas Groten; Martin Zirkl; Anja Haase; A. Sawatdee; G. Scheipl
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Paper Abstract

This work demonstrates a novel surface scanning method for the quantitative determination of the local pyroelectric coefficient in ferroelectric thin films. Such films find application in flexible and large-area printed ferroelectric sensors for gesture-controlled non-touch human-machine interface devices.

The method is called Pyroelectric Scanning Probe Microscopy (PyroSPM)[1] and allows generating a map of the pyroelectric response with very high spatial resolution. In domains of previously aligned dipole moments small heat fluctuations are achieved by laser diode excitation from the bottom side thus inducing changes in the surface potential due to the pyroelectric effect. Simultaneously, the surface potential variations are detected by scanning surface potential microscopy thus forming the base for the pyroelectric coefficient map. The potential of the method is demonstrated on the basis of ferroelectric semi-crystalline copolymer thin films yielding local maxima of the pyroelectric coefficients around 40µC/m2K. Another promising feature of PyroSPM is the ability to visualize “screened” polarization thus enabling in-depth profiling of polarization distributions and domain formation and to study the composition dependence and the time and frequency behavior of ferroelectric nano-domains.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8479, Organic Semiconductors in Sensors and Bioelectronics V, 847903 (15 October 2012); doi: 10.1117/12.946213
Show Author Affiliations
Barbara Stadlober, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)
Jonas Groten, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)
Martin Zirkl, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)
Anja Haase, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)
A. Sawatdee, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)
G. Scheipl, JOANNEUM RESEARCH Forschungsgesellschaft mbH (Austria)

Published in SPIE Proceedings Vol. 8479:
Organic Semiconductors in Sensors and Bioelectronics V
Ruth Shinar; Ioannis Kymissis, Editor(s)

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