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Proceedings Paper

A Precision Pulsed UV Wavemeter
Author(s): Cheryl J White; Timothy L Boyd; Robert B Michie; John W Keto
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Paper Abstract

A UV wavemeter to determine absolute wavelength to one part in 107 at 308 nm has been fabricated and tested. The wavemeter consists of three fixed-plate, air-spaced Fabry-Perot etalons in an evacuated, thermally stabilized enclosure. The interference patterns created by the signal passing through the etalons are imaged onto silicon-diode arrays. This analog output is digitized and stored, and from the estimated wavelength and the known etalon spacing, a microcomputer calculates the interference order of the first etalon. The fractional order is calculated from the digitized image and used to give a better estimate of the absolute wavelength. This procedure is iterated and the order value refined for each subsequent etalon in the series, allowing increasingly accurate determination of the bandwidth and absolute wavelength. The XeCl spectrum can be resolved with an accuracy of ± 30 MHz, given by the inherent resolution of the calibration technique which involves a frequency-doubled ring dye laser and an iodine reference cell. The wavemeter is capable of similar performance at 351 nm (XeF) and 248 nm (KrF).

Paper Details

Date Published: 22 June 1988
PDF: 3 pages
Proc. SPIE 0912, Pulse Single-Frequency Lasers: Technology and Applications, (22 June 1988); doi: 10.1117/12.945529
Show Author Affiliations
Cheryl J White, Western Research Corporation (United States)
Timothy L Boyd, Western Research Corporation (United States)
Robert B Michie, Western Research Corporation (United States)
John W Keto, University of Texas (United States)

Published in SPIE Proceedings Vol. 0912:
Pulse Single-Frequency Lasers: Technology and Applications
William K. Bischel; Larry A. Rahn, Editor(s)

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