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Proceedings Paper

Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation
Author(s): Robert G Hockaday
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Paper Abstract

With the recent compilation of the low-energy x-ray photoabsorption and scattering factors, it has become more practical to determine low-energy x-ray fluorescence yields and to check the scattering cross sections of materials by x-ray photoexcitation. The x-ray fluorescence yield measurements of carbon in polypropylene, oxygen in mylar, and fluorine in polytetrafluorethylene (teflon), by Al x-ray photoexcitation will be presented. Also a comparison of calculated to observed Al Ka x-ray scattering from these plastics will be presented.

Paper Details

Date Published: 11 July 1988
PDF: 8 pages
Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); doi: 10.1117/12.945493
Show Author Affiliations
Robert G Hockaday, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0911:
X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements
Nancy DelGrande; James A. R. Samson; David Y. Smith, Editor(s)

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