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Proceedings Paper

Soft X-Ray Absorption And Emission Spectra And The Electronic Structure Of Some Exotic Materials
Author(s): D L Ederer; L R Canfield; T A Callcott; K L Tsang; C H Zhang; E T Arakawa
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Paper Abstract

The technique of soft x-ray fluorescence spectroscopy (SXE) is complimentary to that of photoemission spectroscopy (PES). SXE probes the local partial density of states (PDOS), selects dipole allowed symmetries, and is not necessarily surface sensitive. PES on the other hand, averages over the DOS and can be used to measure the dispersion of the energy bands. PES is also very surface sensitive. We present measurements on the high Tc superconductors, the quasicrystalline phase of A1Mn, and the LiAl intermetallic alloy. These measurements provide insight for theoretical modeling. In the case of the high Tc compound and the intermetallic compound the measurements are in good agreement with the theory. However, for the quasicrystals the measurements provide new insights to challenge theory.

Paper Details

Date Published: 11 July 1988
PDF: 5 pages
Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); doi: 10.1117/12.945479
Show Author Affiliations
D L Ederer, National Bureau of Standards (United States)
L R Canfield, National Bureau of Standards (United States)
T A Callcott, University of Tennessee (United States)
K L Tsang, University of Tennessee (United States)
C H Zhang, University of Tennessee (United States)
E T Arakawa, Oak Ridge National Laboratory (United States)


Published in SPIE Proceedings Vol. 0911:
X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements
Nancy DelGrande; James A. R. Samson; David Y. Smith, Editor(s)

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