Share Email Print

Proceedings Paper

A New Instrument For Constant (B-Bo) Scatter Mapping Of Contiguous Optical Surfaces Of Up To 25 Square Inches
Author(s): Robert M. Silva; Fred D. Orazio; Robert B. Sledge
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The measurement of scattered light has become more important during the past few years because of the increased ability to use this information in evaluating low scatter optics such as space optics, ring laser gyro and high energy laser optics, and most particularly, in the evaluation of electronic materials. Single point measurements are also no longer sufficient for characterizing surfaces, since it has been found that point to point variations in scatter can be of considerable magnitude. The instrument described in this paper is a highly accurate scatter measuring system which is capable of taking more than 150 million data points in a 125 x 125mm (5" x 5") square area. This data can be used to analyze both the surface and subsurface characteristics of a test article and the information used as a feedback mechanism to change the production process for improved quality.

Paper Details

Date Published: 17 January 1985
PDF: 6 pages
Proc. SPIE 0511, Stray Radiation IV, (17 January 1985); doi: 10.1117/12.945034
Show Author Affiliations
Robert M. Silva, VTI, Inc. (United States)
Fred D. Orazio, VTI,Inc. (United States)
Robert B. Sledge, VTI,Inc. (United States)

Published in SPIE Proceedings Vol. 0511:
Stray Radiation IV
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top