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Proceedings Paper

Devices For Measuring MTFs In The Infrared
Author(s): Kenneth Pulliam; Stephen McHugh
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Paper Abstract

MTFs are usually computed indirectly from spread functions. The patterns used to generate these functions lead to certain problems in infrared systems. Square wave patterns have some advantages but also have some disadvantages. Sine wave patterns are useful but generally must be produced as area patterns. Various ways of using sinusoidal patterns are described.

Paper Details

Date Published: 21 January 1985
PDF: 8 pages
Proc. SPIE 0510, Infrared Technology X, (21 January 1985); doi: 10.1117/12.944999
Show Author Affiliations
Kenneth Pulliam, Electro Optical Industries, Inc. (United States)
Stephen McHugh, Electro Optical Industries, Inc. (United States)

Published in SPIE Proceedings Vol. 0510:
Infrared Technology X
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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