Share Email Print
cover

Proceedings Paper

Aspheric Measurement By Scanning Interferometry
Author(s): Gordon J. Watt
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The contents describe interferometry, define its limitations on diamond machining surfaces, and will state the assumption on which this work is based. The background of the problems and difficulty of using existing test methods to acquire various fringe patterns caused by surface imperfections and the interpretation of those fringe patterns is discussed. A summary description of Phase I of the program is reviewed. In the current system, which is Phase II, a method of obtaining an interferogram of a thin radial swath of the surface has been developed. The method of rotating the part and observing the variation of the radial interferometric signature to obtain a topographic map of the part surface is discussed.

Paper Details

Date Published: 11 December 1984
PDF: 10 pages
Proc. SPIE 0508, Production Aspects of Single Point Machined Optics, (11 December 1984); doi: 10.1117/12.944961
Show Author Affiliations
Gordon J. Watt, Kollmorgen (United States)


Published in SPIE Proceedings Vol. 0508:
Production Aspects of Single Point Machined Optics
Donald P. Brehm, Editor(s)

© SPIE. Terms of Use
Back to Top