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Proceedings Paper

Novel Method For The Analysis Of Printed Circuit Images
Author(s): Jon R. Mandeville
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Paper Abstract

To keep pace with the trend towards increased circuit integration, printed circuit patterns are becoming denser and more complex. A variety of automated visual inspection methods to detect circuit defects during manufacturing have been proposed. This paper describes a method that is a synthesis of the reference-comparison and the generic property approaches that exploits their respective strengths and over-comes their respective weaknesses. It is based on the observation that the local geometric and global topological correctness of a printed circuit can be inferred from the correctness of simplified, skeletal versions of the circuit in a test image. These operations can be realized using simple processing elements which are well suited for implementation in hardware.

Paper Details

Date Published: 4 December 1984
PDF: 11 pages
Proc. SPIE 0504, Applications of Digital Image Processing VII, (4 December 1984); doi: 10.1117/12.944849
Show Author Affiliations
Jon R. Mandeville, IBM Thomas J. Watson Research Lab (United States)

Published in SPIE Proceedings Vol. 0504:
Applications of Digital Image Processing VII
Andrew G. Tescher, Editor(s)

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