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Proceedings Paper

Analysis And Measurement Of Resolution Of Shadow Mask CRT Displays
Author(s): Harry Veron
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Paper Abstract

Automated measurement techniques have been developed to determine the resolution of any shadow mask CRT-observer configuration. It is based on a linear systems approach which determines the brightness profile that an observer sees at a given distance from the CRT. From the profile, a modulation depth is calculated which is related to visual resolution. Given the limits for visual resolution, the results of the linear systems analysis and measurements can provide design parameters for available CRTs which include shadow mask pitch, spot size, spatial frequency of displayed patterns, observer distance, and color.

Paper Details

Date Published: 24 June 1988
PDF: 5 pages
Proc. SPIE 0901, Image Processing, Analysis, Measurement, and Quality, (24 June 1988); doi: 10.1117/12.944718
Show Author Affiliations
Harry Veron, The MITRE Corporation (United States)


Published in SPIE Proceedings Vol. 0901:
Image Processing, Analysis, Measurement, and Quality
Gary W. Hughes; Patrick E. Mantey; Bernice E. Rogowitz, Editor(s)

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