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Proceedings Paper

Measurement Of Laser Diode Spot Size And Source Astigmatism Using A Phase-Shifting Interferometer
Author(s): Scott L. DeVore
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Paper Abstract

A phase-shifting Mach-Zehnder interferometer was used to measure wavefront phase errors for an uncollimated laser diode source. The axial separation of the beam waists was then computed from the measured wavefront astigmatism and compared with directly measured values and the manufacturer's specifications. An optical disk head was also measured and the focused spot profile was calculated from the measured wavefront and beam apodization. The calculated profile was then compared with spot size measurements using a knife edge scanner.

Paper Details

Date Published: 2 June 1988
PDF: 7 pages
Proc. SPIE 0899, Optical Storage Technology and Applications, (2 June 1988); doi: 10.1117/12.944602
Show Author Affiliations
Scott L. DeVore, WYKO Corporation (United States)


Published in SPIE Proceedings Vol. 0899:
Optical Storage Technology and Applications
Donald B. Carlin; Albert A. Jamberdino; Yoshito Tsunoda, Editor(s)

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