Share Email Print
cover

Proceedings Paper

Linear Systems Approach To Fiber Characterization Using Beam Profile Measurements
Author(s): Michael K. Giles; Ernest M. Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The index profile and core diameter of an optical fiber are often obtained by measuring the irradiance distribution at the output of the fiber. In general, a photodiode with a pinhole aperture is used to scan across the irradiance distribution and thus measure the beam profile. Using linear systems theory, we characterize this measurement process as a convolution operation and present the mathematical formalism used to estimate the achievable measurement accuracy. Experimental data are presented which confirm the theoretical results. As an outgrowth of the linear systems analysis, we suggest the use of a scanning slit rather than a pinhole to measure irradiance distributions. We show that the scanning slit is not only easier to implement than the scanning pinhole since it allows more light to be collected, but it also provides accurate beam profile data. Data collected using both techniques (pinhole and slit scanning) are presented and compared for representative beams.

Paper Details

Date Published: 26 December 1984
PDF: 5 pages
Proc. SPIE 0500, Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II, (26 December 1984); doi: 10.1117/12.944581
Show Author Affiliations
Michael K. Giles, New Mexico State University (United States)
Ernest M. Kim, Burroughs Corporation (United States)


Published in SPIE Proceedings Vol. 0500:
Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II
Robert L. Galawa, Editor(s)

© SPIE. Terms of Use
Back to Top