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Proceedings Paper

Characterization Of Thin Film Magnetic Recording Heads Using Transverse Kerr Effect
Author(s): Avtar Singh; Thomas Fugate
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Paper Abstract

This paper proposes a new cost effective method for the testing of thin film magnetic recording heads. The primary advantage of this technique is that through use of magneto-optics, test can be carried out at the wafer level and thereby eliminate defective heads before additional manufacturing costs are added to the product.

Paper Details

Date Published: 2 June 1988
PDF: 5 pages
Proc. SPIE 0898, Miniature Optics and Lasers, (2 June 1988); doi: 10.1117/12.944558
Show Author Affiliations
Avtar Singh, Adelphi Associates (United States)
Thomas Fugate, Adelphi Associates (United States)

Published in SPIE Proceedings Vol. 0898:
Miniature Optics and Lasers
Laurence E. Cramer; Gary T. Forrest; Chandrasekhar Roychoudhuri, Editor(s)

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