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Proceedings Paper

Thermal Wave Imaging: Detection Of Subsurface Features In Opaque Solids
Author(s): John C Murphy; Leonard C Aamodt; Jane W Maclachlan
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Paper Abstract

Thermal wave imaging methods of investigating both surface and near subsurface regions of a specimen are considered. Several mechanisms for subsurface probing are distinguished and issues related to spatial resolution for the various mechanisms are discussed.

Paper Details

Date Published: 12 July 1988
PDF: 9 pages
Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); doi: 10.1117/12.944532
Show Author Affiliations
John C Murphy, Johns Hopkins University (United States)
Leonard C Aamodt, Johns Hopkins University (United States)
Jane W Maclachlan, Johns Hopkins University (United States)

Published in SPIE Proceedings Vol. 0897:
Scanning Microscopy Technologies and Applications
E. Clayton Teague, Editor(s)

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