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Proceedings Paper

Surface Plasmon Scanning Microscopy
Author(s): Eric M Yeatman; Eric A Ash
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Paper Abstract

The use of surface plasmon resonance measurements for the microscopical imaging of surfaces and thin films has been investigated. Theoretical results are presented for sensitivity optimization and focussed beam measurement. Experimental results are presented for scanned beam and plane-wave imaging of silver surfaces and superimposed dielectric layers. Thickness sensitivity of about 3 angstroms has been achieved, with lateral resolution better than 20 microns.

Paper Details

Date Published: 12 July 1988
PDF: 10 pages
Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); doi: 10.1117/12.944524
Show Author Affiliations
Eric M Yeatman, Imperial College of Science and Technology (England)
Eric A Ash, Imperial College of Science and Technology (England)

Published in SPIE Proceedings Vol. 0897:
Scanning Microscopy Technologies and Applications
E. Clayton Teague, Editor(s)

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