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Proceedings Paper

Linear And Differential Techniques In The Scanning Optical Microscope
Author(s): M.Vaez Iravani; C W See
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Paper Abstract

The limitations of the scanning optical microscope in producing high contrast images of nearly uniform objects are discussed. It is shown that by resorting to linear and differential imaging concepts, a number of techniques can be devised 'which overcome such inherent limitations. The design and operation of a scanning differential amplitude, and linear differential interference contrast microscopes are discussed, and a number of experimental results are presented. These microscopes are capable of stable operation and sensitivity down to 10-6 in detecting a refractive index change, and 1.5>10-4nm height variation, in a 1 kHz bandwidth.

Paper Details

Date Published: 12 July 1988
PDF: 12 pages
Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); doi: 10.1117/12.944507
Show Author Affiliations
M.Vaez Iravani, North American Philips Corporation (United States)
C W See, University College (London)


Published in SPIE Proceedings Vol. 0897:
Scanning Microscopy Technologies and Applications
E. Clayton Teague, Editor(s)

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