Share Email Print
cover

Proceedings Paper

Probing Surfaces With The Atomic Force Microscope
Author(s): O Marti; B Drake; S Gould; P K Hansma
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Atomic Force Microscope can resolve features on conducting or nonconducting surfaces down to the atomic level. The heights of features are recorded as a sharp tip scans over the surface in parallel scans. The interaction between the tip and the surface is the interaction potential between atoms. Individual carbon atoms separated by 0.146 nm have been resolved on graphite. Ordered structure on the "native" oxide of silicon has been observed. Rows of molecules that are separated by 0.5 nm have been resolved in an organic monolayer. The key to the operation of an AFM is the development of a system for sensing tracking forces that are small enough to avoid damaging the surface. The images in this report were obtained by sensing with electron tunneling the deflection 1 - 10 nm) of springs (k 0.1 - 100 N/m) fabricated from silicon oxide or fine wires.

Paper Details

Date Published: 12 July 1988
PDF: 4 pages
Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); doi: 10.1117/12.944502
Show Author Affiliations
O Marti, University of California (United States)
B Drake, University of California (United States)
S Gould, University of California (United States)
P K Hansma, University of California (United States)


Published in SPIE Proceedings Vol. 0897:
Scanning Microscopy Technologies and Applications
E. Clayton Teague, Editor(s)

© SPIE. Terms of Use
Back to Top