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Proceedings Paper

Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum
Author(s): Sang-il Park; J Nogami; C F Quate
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Paper Abstract

The scanning tunneling microscope(STM) has the capability of mapping the topography of a surface with unprecedented resolution in both vertical and lateral directions. STM has been used to obtain real space images of individual atoms on a surface. In this paper we review the principles and technical aspects of STM, and give some examples of its applications both in air and vacuum. These include images of graphite, silicon, and indium on silicon. Several techniques of digital image processing developed to facilitate the analysis of STM data are also described.

Paper Details

Date Published: 12 July 1988
PDF: 8 pages
Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); doi: 10.1117/12.944500
Show Author Affiliations
Sang-il Park, Stanford University (United States)
J Nogami, Stanford University (United States)
C F Quate, Stanford University (United States)

Published in SPIE Proceedings Vol. 0897:
Scanning Microscopy Technologies and Applications
E. Clayton Teague, Editor(s)

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