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Proceedings Paper

Polyphenylene Sulfide Dielectric Insulators In X-Ray Preionized XeCl Discharge Lasers
Author(s): D A Gobeli; D Lorenz; W L Willis
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Paper Abstract

The physical and chemical degradation of dielectric materials in excimer lasers is generally considered to be one of their primary lifetime limiting factors. Adverse chemical, radiation, thermal, and mechanical environmental factors coupled with the high costs when scaling to multijoule output energies has prompted feasibility testing of new dielectric materials for use in large discharge pumped XeC1 systems currently under development. Glass-filled polyphenylene sulfide (hereafter referred to as PPS)[1] is a modern thermoplastic possessing a number of desirable mechanical and electrical properties that has prompted an investigation for it's use as a dielectric and structural material in x-ray preionized, discharge-pumped XeC1 lasers. Teflon and Kynar, which had been used previously in a number of designs, have good resistance to chemical attack in the discharge environment and good electrical resistance properties, but are mechanically less desirable and can be very costly to incorporate into large, multijoule excimers because of difficulties in their fabrication. PPS is also quite resistant to attack by the active components of XeC1 laser gas, possesses superior mechanical properties to either Teflon or Kynar and is much less costly to incorporate into existing designs.

Paper Details

Date Published: 12 July 1988
PDF: 4 pages
Proc. SPIE 0894, Gas Laser Technology, (12 July 1988); doi: 10.1117/12.944388
Show Author Affiliations
D A Gobeli, Northrop Corporation (United States)
D Lorenz, Northrop Corporation (United States)
W L Willis, Northrop Corporation (United States)

Published in SPIE Proceedings Vol. 0894:
Gas Laser Technology
Peter P. Chenausky; Roland A. Sauerbrey; James H. Tillotson, Editor(s)

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