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Proceedings Paper

Interframe Jitter Measurement Technique
Author(s): J. C. Brown
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Paper Abstract

A noninvasive technique for the measurement of image jitter has been developed. This technique has been applied to a common module thermal imager to show that scanner position oscillations about linearity are exacerbated by power supply fluctuations.

Paper Details

Date Published: 3 May 1988
PDF: 3 pages
Proc. SPIE 0890, Infrared Systems and Components II, (3 May 1988); doi: 10.1117/12.944283
Show Author Affiliations
J. C. Brown, Center for Night Vision & Electro-Optics (United States)

Published in SPIE Proceedings Vol. 0890:
Infrared Systems and Components II
H.M. Charles Liaw, Editor(s)

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