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Proceedings Paper

Multilayer Thin Film Simulation Of Volume Holograms
Author(s): Jon D. Masso
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Paper Abstract

Multilayer thin film theory for a quarterwave stack of thin films is compared with the coupled wave analysis of unslanted reflection volume holograms. The thin film analysis is then extended to simulate holograms in which the average index, index modulation amplitude, and index modulation wavelength are a function of depth in the hologram. Specific examples are shwon which correspond to the spectral shape of actual holographic notch filters. Phenomenological mechanisms are postulated to explain the line shape based on the theoretical analysis.

Paper Details

Date Published: 12 April 1988
PDF: 7 pages
Proc. SPIE 0883, Holographic Optics: Design and Applications, (12 April 1988); doi: 10.1117/12.944126
Show Author Affiliations
Jon D. Masso, American Optical Corporation (United States)

Published in SPIE Proceedings Vol. 0883:
Holographic Optics: Design and Applications
Ivan Cindrich, Editor(s)

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