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Proceedings Paper

Four-Wave Mixing And Scanning Tunneling Microscopy Of Semiconductor Clusters
Author(s): Dror Sarid; B P McGinnis; Tammy D Henson
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Paper Abstract

Semiconductor structures in lower dimensions, dubbed quantum dots, exhibit novel properties which result from size quantization of their charge carriers, as well as from their large surface-to-volume ratio. Optical measurements, combined with scanning tunneling microscopy, can provide the detailed information required to model the nonlinear optical response of these clusters.

Paper Details

Date Published: 3 May 1988
PDF: 8 pages
Proc. SPIE 0881, Optical Computing and Nonlinear Materials, (3 May 1988); doi: 10.1117/12.944070
Show Author Affiliations
Dror Sarid, University of Arizona (United States)
B P McGinnis, University of Arizona (United States)
Tammy D Henson, University of Arizona (United States)

Published in SPIE Proceedings Vol. 0881:
Optical Computing and Nonlinear Materials
Nasser Peyghambarian, Editor(s)

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