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Proceedings Paper

Roughness Of Films And Surfaces Studied By Optical Lateral Waves
Author(s): Oliver S. Heavens
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Paper Abstract

A lateral wave appears at an interface between two media when a bounded beam is incident in the denser medium at the critical angle. The evanescent penetration into the less dense medium offers a method of exploring the interface region and has been used to study weak absorption. In this paper, results relating to the effects of surface roughness and deposited film inhomogeneities are discussed.

Paper Details

Date Published: 27 March 1985
PDF: 4 pages
Proc. SPIE 0492, 1984 European Conf on Optics, Optical Systems, and Applications, (27 March 1985); doi: 10.1117/12.943700
Show Author Affiliations
Oliver S. Heavens, University of York (United Kingdom)

Published in SPIE Proceedings Vol. 0492:
1984 European Conf on Optics, Optical Systems, and Applications
Bouwe Bolger; Hedzer A. Ferwerda, Editor(s)

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