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Proceedings Paper

Application Of Interferometry And Holography For Precision Measurements
Author(s): Hans J. Tiziani
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Paper Abstract

Phase measurement techniques are becoming a useful tool for precision measurements. Spatial as well as temporal phase shift methods can be used. Optical testing, where computer analysis of interference fringes is becoming increasing important, will be discussed in connection with testing optical components,microprofilbs as well as for testing aspheric surfaces. In addition, methods using heterodyne techniques and real time holography will be described.

Paper Details

Date Published: 27 March 1985
PDF: 8 pages
Proc. SPIE 0492, 1984 European Conf on Optics, Optical Systems, and Applications, (27 March 1985); doi: 10.1117/12.943686
Show Author Affiliations
Hans J. Tiziani, University of Stuttgart (Germany)

Published in SPIE Proceedings Vol. 0492:
1984 European Conf on Optics, Optical Systems, and Applications
Bouwe Bolger; Hedzer A. Ferwerda, Editor(s)

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