Share Email Print

Proceedings Paper

Charge Coupled Devices Vs. Microchannel Plates In The Extreme And Far Ultraviolet : A Comparison Based On The Latest Laboratory Measurements.
Author(s): J. Vallerga; M. Lampton
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Microchannel plates (MCPs) have been used as imaging photon counters successfully in the extreme and far ultraviolet (EUV and FUV) for many years. Charge Coupled Devices (CCDs), on the other hand, have become established for low light level sensing at visible and near infrared wavelengths (as well as X-ray). Recently, CCDs have been proposed as EUV and FUV detectors. With proper thinning and backside (input) surface treatments, the CCD quantum efficiency in the EUV and FUV is comparable and sometimes exceeds MCPs. A comparison of MCPs and CCDs for use in EUV and FUV low light level imaging is presented including: quantum efficiency, spatial resolution, format size, dynamic range and long term stability. The current best measured results for each detector type are reviewed as well as their own unique problems and limitations. The low light sensitivities in the ultraviolet achievable with optimized detector systems of each type are compared quantitatively for both for space-based astronomical and spectroscopic applications.

Paper Details

Date Published: 13 April 1988
PDF: 6 pages
Proc. SPIE 0868, Optoelectronic Technologies for Remote Sensing from Space, (13 April 1988); doi: 10.1117/12.943596
Show Author Affiliations
J. Vallerga, University of California at Berkeley (United States)
M. Lampton, University of California at Berkeley (United States)

Published in SPIE Proceedings Vol. 0868:
Optoelectronic Technologies for Remote Sensing from Space
C. Stuart Bowyer; John S. Seeley, Editor(s)

© SPIE. Terms of Use
Back to Top