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Proceedings Paper

Limitations In Optical System Performance Due To Silicon PIN Photodiode Defects
Author(s): S G Methley; J P Moss
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Paper Abstract

Fundamental limitations in optical system performance are demonstrated to be caused by deficiencies in Si photodetector operation. Static electrical testing may identify groups of devices showing specific levels of digital optical line system performance. The mechanism is shown to be inherent in the Si-Si02 system, and sensitive to device structure.

Paper Details

Date Published: 1 January 1987
PDF: 6 pages
Proc. SPIE 0866, Materials and Technologies for Optical Communications, (1 January 1987); doi: 10.1117/12.943575
Show Author Affiliations
S G Methley, British Telecom Research Laboratories (UK)
J P Moss, British Telecom Research Laboratories (UK)

Published in SPIE Proceedings Vol. 0866:
Materials and Technologies for Optical Communications
Alain P. Brenac, Editor(s)

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