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Proceedings Paper

Physical Limitations To Nonuniformity Correction In IR Focal Plane Arrays
Author(s): D A Scribner; M R Kruer; J C Gridley; K Sarkady
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Paper Abstract

Simple nonuniformity correction algorithms currently in use can be severely limited by nonlinear response characteristics of the individual pixels in an IR focal plane array. Although more complicated multi-point algorithms improve the correction process they too can be limited by nonlinearities. Furthermore, analysis of single pixel noise power spectrums usually show some level of 1 /f noise. This in turn causes pixel outputs to drift independent of each other thus causing the spatial noise (often called fixed pattern noise) of the array to increase as a function of time since the last calibration. Measurements are presented for two arrays (a HgCdTe hybrid and a Pt:Si CCD) describing pixel nonlinearities, 1/f noise, and residual spatial noise (after nonuniforming correction). Of particular emphasis is spatial noise as a function of the lapsed time since the last calibration and the calibration process selected. The resulting spatial noise is examined in terms of its effect on the NEAT performance of each array tested and comparisons are made. Finally, a discussion of implications for array developers is given.

Paper Details

Date Published: 3 May 1988
PDF: 18 pages
Proc. SPIE 0865, Focal Plane Arrays: Technology and Applications, (3 May 1988); doi: 10.1117/12.943565
Show Author Affiliations
D A Scribner, Naval Research Laboratory (United States)
M R Kruer, Naval Research Laboratory (United States)
J C Gridley, Naval Research Laboratory (United States)
K Sarkady, Sachs-Freeman Associates Inc. (United States)


Published in SPIE Proceedings Vol. 0865:
Focal Plane Arrays: Technology and Applications
Jean-Pierre Chatard, Editor(s)

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