Share Email Print
cover

Proceedings Paper

Elaboration And Properties Of A Linear Pyroelectric Pvdf Focal Plane Array
Author(s): A Reynes; D Esteve; J Farre; V V Pham; J J Simonne
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The polyvinylidene fluoride, PVCV, has demonstrated, since a few years, its better feasibility than that exhibited by ceramics in pyroelectric detection, and performances of discrete PVDF IR detectors have already been presented [1]. A new step toward the development of a focal plane matrix array is analyzed in this paper, in which technology and properties of a PVDF linear array are detailed. A first, advantages and drawbacks of the photolithography technique applied to PVDF are widely discussed and compared with the metal deposition using direct evaporation or sputtering through a metallic mask. Then, the use of the R.T. poling procedure developed by F. Bauer on a biaxially stretched PVDF is recalled. Finally, the technique used to elaborate a 10 pixels linear array, accounting for a proper selection of the polymer thickness is presented. Influence of this choice on the thermal cut off frequency, on the electrical cut off frequency and on the response of the elementary unit is determined and modelized. Characterization of tie whole structure, concerning response dispersion and cross talk between units and sensitivity of the linear array is analyzed. Results are shown to be most encouraging to prepare the next step dealing with the F.P. matrix array.

Paper Details

Date Published: 3 May 1988
PDF: 5 pages
Proc. SPIE 0865, Focal Plane Arrays: Technology and Applications, (3 May 1988); doi: 10.1117/12.943543
Show Author Affiliations
A Reynes, C.N.R.S. (France)
D Esteve, C.N.R.S (France)
J Farre, C.N.R.S (France)
V V Pham, C.N.R.S (France)
J J Simonne, C.N.R.S (France)


Published in SPIE Proceedings Vol. 0865:
Focal Plane Arrays: Technology and Applications
Jean-Pierre Chatard, Editor(s)

© SPIE. Terms of Use
Back to Top