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Proceedings Paper

Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis
Author(s): Richard W.T. Preater
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Paper Abstract

Pulsed Laser Electronic Speckle Pattern Interferometry (ESPI) has been shown to be a technique which permits the measurement of in-plane displacements and hence strain under dynamic conditions, in particular radial displacements on rotating components. Conventional optics initially showed the limiting tangential velocity to be of the order of 60 ms-1 for a reasonable area of interference fringe information. Novel optics increases the tangential velocity range to that in excess of 150 ms-1. Use of a pulsed laser removes the otherwise rigorous stability requirement of c/w systems including holography and would allow measurements to be made in an industrial environment. Recent preliminary tests using fibre optics indicate that they may be used for components with limited optical access.

Paper Details

Date Published: 1 June 1988
PDF: 5 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943507
Show Author Affiliations
Richard W.T. Preater, The City University (England)

Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)

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