Share Email Print
cover

Proceedings Paper

Optoelectronic Measurement Systems In The Industrial Field At The Aerospatiale Aquitaine Plant
Author(s): C. Le Floc'h
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Aerospatiale Aquitaine plant implements optical techniques using coherent light for its own activities or for research financed by government authorities. This paper gives two examples of that. The first one concerns two optical measurement systems used to improve the knowledge of the composite materials behavior under space environment : - a facility based on two interferometers to measure the thermal expansion coefficient, - and an optical device to follow the evolution of the composite material's mechanical characterics submitted to accelerated ageing in a space environment (ultra violet, protonic, and electronic rays). The second example presents an ophtalmological study where we implement optical methods in order to characterize a shock wave in a liquid initiated with an YAG laser : schlieren's optoelectronic technique based on a deflection of a test laser beam that depends on the index variation as the wave passes ; otherwise a shadowscopy technique and a Mach Zehnder interferometric technique are implemented to obtain the shape of the wave. For each example some results are given to show the performances of these optical measurement methods. We think that this large field of applications illustrates the interest in suitable optoelectronic tools.

Paper Details

Date Published: 1 June 1988
PDF: 6 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943502
Show Author Affiliations
C. Le Floc'h, Aerospatiale BP (France)


Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)

© SPIE. Terms of Use
Back to Top