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Proceedings Paper

Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry
Author(s): W. Schwab; J. Gutjahr; A. Ettemeyer; H. Kockelmann
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Paper Abstract

A holographic arrangement using two holograms symmetrically placed to the perpendicular of the component under investigation will be introduced. By means of a simple difference method using an image processing system, the relative in-plane-displacement and corresponding strain in a defined direction can be determined. The effects of other directional movements (e.g. tilting) will be fully compensated.

Paper Details

Date Published: 1 June 1988
PDF: 8 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943499
Show Author Affiliations
W. Schwab, Universitat Stuttgart (Germany)
J. Gutjahr, Fachhochschule Köln (Germany)
A. Ettemeyer, Universitat Stuttgart (Germany)
H. Kockelmann, Universitat Stuttgart (Germany)


Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)

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