Share Email Print
cover

Proceedings Paper

Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology
Author(s): Ole J. Lokberg; Jan T. Malmo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The introduction of compact, robust and stable ESPI-instruments has opened for new applications of the technique outside the laboratory environments. We briefly describe a typical system and discuss how it may be used in hostile environments to measure on difficult objects.

Paper Details

Date Published: 1 June 1988
PDF: 6 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943496
Show Author Affiliations
Ole J. Lokberg, The Norwegian Institute of Technology (Norway)
Jan T. Malmo, SINTEF (Norway)


Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)

© SPIE. Terms of Use
Back to Top