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Proceedings Paper

An Ellipsometry System For High Accuracy Metrology Of Thin Films
Author(s): George A. Candela; Deane Chandler-Horowitz
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Paper Abstract

A computer-controlled spectroscopic ellipsometer of high accuracy has been designed and constructed. A theta-two-theta goniometer unit and optical rail system allows various ellipsometric methods to be used to measure the parameters A and 4). Three important methods under study for accuracy, precision, and speed of measurement are the conventional null method, the rotating analyzer method, and the principal angle method. All the goniometer angles, including the angle of incidence, can be measured to an accuracy of 0.001 deg. The present light sources are two lasers with fixed wavelengths, 632.8 nm and 441.6 nm, in addition to a monochromator that can be used to scan the wavelength range from 190 to 2600 nm. A unique sample alignment system which utilizes two quadrant detectors has been developed and a simple but very effective nulling scheme is used. This instrument is primarily used for the metrology of semiconductor materials and for the calibration of reference standards for thin film thickness and refractive index.

Paper Details

Date Published: 15 October 1984
PDF: 7 pages
Proc. SPIE 0480, Integrated Circuit Metrology II, (15 October 1984); doi: 10.1117/12.943040
Show Author Affiliations
George A. Candela, National Bureau of Standards (United States)
Deane Chandler-Horowitz, National Bureau of Standards (United States)


Published in SPIE Proceedings Vol. 0480:
Integrated Circuit Metrology II
Diana Nyyssonen, Editor(s)

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