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Proceedings Paper

Color Quality Inspection Of Imaging Device
Author(s): Toshio Asano; Seiji Hata; Susumu Koishikawa; Youichi Shimizu
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Paper Abstract

This paper describes an automated color defect inspection system of color imaging devices. The system uses color image processing technology, but does not use conventional primary color (R,G,B) components. In this system, two kinds of chrominance signals (R-Y, B-Y) are introduced to analyze color images. Newly developed color edge detection and color contrast calculation methods are used to detect and evaluate the color defects. Color contrast are calculated by analyzing the two dimensional chrominance signal's scatterplot. Algorithms of color defect inspection and experimental results are presented.

Paper Details

Date Published: 19 October 1987
PDF: 7 pages
Proc. SPIE 0856, IECON '87: Industrial Applications of Robotics & Machine Vision, (19 October 1987); doi: 10.1117/12.943029
Show Author Affiliations
Toshio Asano, Production Engineering Research Lab. Hitachi Ltd. (Japan)
Seiji Hata, Production Engineering Research Lab. Hitachi Ltd. (Japan)
Susumu Koishikawa, Mobara Works Hitachi Ltd. (Japan)
Youichi Shimizu, Mobara Works Hitachi Ltd. (Japan)

Published in SPIE Proceedings Vol. 0856:
IECON '87: Industrial Applications of Robotics & Machine Vision
Abe Abramovich, Editor(s)

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