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Proceedings Paper

Surface Orientation From Polarization Images
Author(s): Lawrence B. Wolff
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Paper Abstract

It is demonstrated that measurement of local surface orientation for a wide variety of isotropically rough material surfaces can be achieved from knowledge of the polarization states of both incident and reflected light radiation upon and from the surface respectively. The reflection model used is the Torrance-Sparrow model assuming combined specular and diffuse reflection. The specular and diffuse reflection components have distinct polarization states which makes it possible to resolve intersecting specular and diffuse equireflection curves in gradient space thereby measuring surface orientation. The light source incident orientation and the viewer orientation are assumed to be known along with the complex index of refraction of the material surface and the root mean square slope of planar microfacets characterizing surface roughness. The theoretical development is very comprehensive with respect to the nature of the incident and reflected light radiation which is assumed to be quasi-monochromatic having arbitrary degree of polarization. Thus determination of surface orientation is feasible using incident incoherent natural sunlight which is completely unpolarized, using incident partially polarized light such as specularly reflected natural sunlight, or using completely polarized incident light such as light which is elliptically polarized including circular and linear polarizations.

Paper Details

Date Published: 12 March 1988
PDF: 12 pages
Proc. SPIE 0850, Optics, Illumination, and Image Sensing for Machine Vision II, (12 March 1988); doi: 10.1117/12.942866
Show Author Affiliations
Lawrence B. Wolff, Columbia University (United States)


Published in SPIE Proceedings Vol. 0850:
Optics, Illumination, and Image Sensing for Machine Vision II
Donald J. Svetkoff, Editor(s)

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