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Proceedings Paper

Cooperative Target Attitude Measurement
Author(s): Francis G. Bretaudeau; Sylvie J. LagardE; Christine G. Enault
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Paper Abstract

This paper presents a cooperative target's attitude measurement system using properties of plane, specular and circular symetrical pattern features ; when the light source is on the axis of such a transparent pattern M, or when the light source and the detector have common location D for a reflecting one, then the shining points of M define a straight line segment passing through the projection J of D. Point J can be located using either one camera and several coplanar patterns or one pattern and several cameras. In the latter arrangement, point J coordinates can be computed using the cameras coordinate systems passage matrix. A camera calibration methodology, built upon these pattern use, has been envolved. Two experimental attitude measurement systems have been set up and the joined pattern recognition methodologies developped. The first one has been developped for space docking (accuracy : 1°, view field : 40°, distance : from 0.1 up to lm ) and the other has been applied to aircraft attitude computation during landing on aircraft carrier deck ( accuracy : 0.1°, view field : 5°, distance : 800 m ). For this experiment, atmospheric turbulence perturbations can be reduced by averaging points J obtained for uncorrelated measurements. These measurements accuracy have then been compared to those of another attitude sensor : its developpement is based upon the possibility to recognize and 3-D reconstruct a known polygonal shape from its image.

Paper Details

Date Published: 12 March 1988
PDF: 5 pages
Proc. SPIE 0850, Optics, Illumination, and Image Sensing for Machine Vision II, (12 March 1988); doi: 10.1117/12.942857
Show Author Affiliations
Francis G. Bretaudeau, ONERA (France)
Sylvie J. LagardE, ONERA (France)
Christine G. Enault, ONERA (France)

Published in SPIE Proceedings Vol. 0850:
Optics, Illumination, and Image Sensing for Machine Vision II
Donald J. Svetkoff, Editor(s)

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