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Proceedings Paper

Optically Controlled Millimeter-Wave Devices
Author(s): A. M. Vaucher; M. G. Li; C. D. Striffler; C. H. Lee
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Paper Abstract

A dynamic bridge method has been developed to measure the time varying phase shift and attenuation of millimeter-waves in semiconductor waveguides when perturbed by optically induced plasmas. The resolution of this technique is 2 ns in real time. Comparison of this method with a theoretical model is also discussed.

Paper Details

Date Published: 1 November 1987
PDF: 5 pages
Proc. SPIE 0477, Optical Technology for Microwave Applications I, (1 November 1987); doi: 10.1117/12.942622
Show Author Affiliations
A. M. Vaucher, University of Maryland (United States)
M. G. Li, University of Maryland (United States)
C. D. Striffler, University of Maryland (United States)
C. H. Lee, University of Maryland (United States)


Published in SPIE Proceedings Vol. 0477:
Optical Technology for Microwave Applications I
Shi-Kay Yao, Editor(s)

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