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Proceedings Paper

Laser Interferometric On-Line Measurement Of Surface Roughness Laboratory And Plant Application In Paper Industry
Author(s): E. Lorincz; P. Richter; I. Peczeli; F. Engard
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Paper Abstract

Equipment for non-contact on-line determination of surface roughness is presented. Light of a He-Ne laser scattered by the surface of a moving material (e.g.paper) is detected using an interferometer.Laboratory tests gave good correlation between the results of the optical and traditional methods. Plant application made possible to control reproducibility and observe the effect of technological processes.

Paper Details

Date Published: 18 January 1985
PDF: 3 pages
Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942408
Show Author Affiliations
E. Lorincz, Technical University Budapest (Hungary)
P. Richter, Technical University Budapest (Hungary)
I. Peczeli, Technical University Budapest (Hungary)
F. Engard, Technical University Budapest (Hungary)


Published in SPIE Proceedings Vol. 0473:
Symposium Optika '84
Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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