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Proceedings Paper

A Two-Dimensional Diffraction pattern Sampling With Stationary Single Detector
Author(s): Marek Daszkiewicz; Jacek Galas
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Paper Abstract

The diffraction pattern analysis requires very well corrected lenses. The diffraction patterns are usually sampled by detector moved strictly in the Fourier plane or by especially desired multielement detectors. A new sampling method is proposed. In this method a stationary single detector is placed in the focus of transforming lens, while the sampled diffraction pattern is moved in the Fourier plane. The movement of a diffraction pattern can be obtained by illumination of the investigated structure with a parallel light beam, which changes its inclination to the optical axis of the transforming lens. Simple lenses and detectors for diffraction pattern analysis can be used. The experiments with two-dimensional samplinq have been performed. A continuous change of the illumination beam direction have been obtained by rotating, a glass wedge with variable convex angle. In this way the diffraction pattern is sampled along the Archimedean spiral trace. This type of sampling gives the light intensity distribution in the polar coordinates. Results of the experiments are presented. They show the possibility of application of this method in practice.

Paper Details

Date Published: 18 January 1985
PDF: 4 pages
Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942407
Show Author Affiliations
Marek Daszkiewicz, Central Optical Laboratory (Poland)
Jacek Galas, Central Optical Laboratory (Poland)

Published in SPIE Proceedings Vol. 0473:
Symposium Optika '84
Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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