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Proceedings Paper

Evaluation Of Holographic Interferograms By Parametric Representation Of The Displacement Vector Field
Author(s): G. Szarvas; A. Adam; I. Bogar; Z. Fuzessy; F. Gyimesi
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Paper Abstract

One of the difficulties of widespread application of hologram interferometry in industry is the unsolved problem of rapid, automatic evaluation of interferograms. By means of its simplicity and accuracy the zero order fringe distinguishes itself among the other ones. The industrial application of the technique is made more difficult by the fact that interferograms recorded in factory environment do not contain the zero order fringe. There is no way to produce such a system in which the object and interferometer would not be moved to each other by an order of magnitude of the wave length of the light. So the zero order fringe technique can only be used if the fringes are calibrated i.e. if only the absolute order number of a fringe is determined. The fringes can be calibrated by holographic technique /fringe counting technique/ or by another way /using the values of displacement components measured by dial indicator or vibrometer with piezoelectrical head./ The disadvantages of that techniques are their combined nature, claim to the complicated equipment and procedures differing from the relatively simple zero order fringe method. In the present paper a method called parametric calibration of fringe order will be proposed. The absolute displacement vector of the object surface points is determined using the relative fringe order number. The suggested method is suitable for the calibration of the interference fringes /for the determination of the absolute fringe order/ in a nearly plane region of the object.

Paper Details

Date Published: 18 January 1985
PDF: 4 pages
Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942384
Show Author Affiliations
G. Szarvas, Technical University Budapest (Hungary)
A. Adam, Technical University Budapest (Hungary)
I. Bogar, Technical University Budapest (Hungary)
Z. Fuzessy, Technical University Budapest (Hungary)
F. Gyimesi, Technical University Budapest (Hungary)


Published in SPIE Proceedings Vol. 0473:
Symposium Optika '84
Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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