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Proceedings Paper

An ESPI Contouring Technique In Strain Analysis
Author(s): Svein Winther; Gudmunn A. Slettemoen
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Paper Abstract

A new electronic speckle pattern interferometric (ESPI) contouring technique, which is a variation of the holographic two beam illumination method, is described. Together with necessary mathematical derivations, experimental test results are reported. The system is an integrated part of a deformation measuring system where contour data will be used in strain analysis.

Paper Details

Date Published: 18 January 1985
PDF: 4 pages
Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942383
Show Author Affiliations
Svein Winther, The Norwegian Institute of Technology (Norway)
Gudmunn A. Slettemoen, The Norwegian Institute of Technology (Norway)

Published in SPIE Proceedings Vol. 0473:
Symposium Optika '84
Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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