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Proceedings Paper

Spectral Cut-Off Behaviour Of Ti:LiNbO3 And Semiconductor Waveguides: Analysis And Experiment
Author(s): M. Meliga; S. Morasca; B. Sordo; C. De Bernardi
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Paper Abstract

The spectrum of modal cut-off wavelengths is studied for waveguides with step and graded index profile. It is shown that by measuring the cut-off wavelength of supported modes it is possible to obtain values for the refractive index of the guiding layer in the step-index case, and information on the diffusion length and the best profile shape for graded-index guides. This method has been experimentally applied to InGaAsP and InGaAlAs waveguides, whose indices are obtained with accuracy to the third decimal place, in favorable comparison to other techniques, and to Ti:LiNb03 guides.

Paper Details

Date Published: 10 March 1988
PDF: 6 pages
Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); doi: 10.1117/12.942361
Show Author Affiliations
M. Meliga, CSELT (Italy)
S. Morasca, CSELT (Italy)
B. Sordo, CSELT (Italy)
C. De Bernardi, CSELT (Italy)

Published in SPIE Proceedings Vol. 0835:
Integrated Optical Circuit Engineering V
Mark A. Mentzer, Editor(s)

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