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Proceedings Paper

Optical Characterization Of Integrated Optical Devices
Author(s): Dan Courtney; Tim Bailey
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Paper Abstract

As integrated optical components become increasingly available, the need for an understanding of methods for characterization of these devices becomes necessary. This paper discusses several techniques for characterization of Ti:LiNb03 devices including waveguides, polarizers and phase modulators. Measurement aspects common to all devices are discussed such as polarization requirements, wavelength, power restrictions and power measurement. In addition, specific techniques for measurement of optical loss, fiber to chip coupling, optical retardation and polarization extinction are given.

Paper Details

Date Published: 10 March 1988
PDF: 11 pages
Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); doi: 10.1117/12.942356
Show Author Affiliations
Dan Courtney, Hamilton Standard (United States)
Tim Bailey, Hamilton Standard (United States)

Published in SPIE Proceedings Vol. 0835:
Integrated Optical Circuit Engineering V
Mark A. Mentzer, Editor(s)

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