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Proceedings Paper

Grazing Incidence Optics: Amplitude-Wavelength Mapping As A Unified Approach To Specification, Theory, And Metrology
Author(s): A. Franks; B. Gale; M. Stedman
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Paper Abstract

The concept of amplitude-wavelength space applied to the development of an x-ray optic provides a means of summarizing and unifying the complex data associated with each stage of its development: the specification; manufacturing tolerances; and metrology. The determination of manufacturing tolerances requires calculation of the image aberrations of perturbed optical systems and is most usefully carried out using a modified asymptotic Debye theory. Its range of applicability and that of other theories is illustrated in amplitude-wavelength space. Subnanometer perturbations are measured by mechanical or optical techniques, and the measuring instruments are calibrated by means of x-ray interferometry in terms of the primary standards of length.

Paper Details

Date Published: 9 August 1988
PDF: 10 pages
Proc. SPIE 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications, (9 August 1988); doi: 10.1117/12.942154
Show Author Affiliations
A. Franks, National Physical Laboratory (UK)
B. Gale, National Physical Laboratory (UK)
M. Stedman, National Physical Laboratory (UK)

Published in SPIE Proceedings Vol. 0830:
Grazing Incidence Optics for Astronomical and Laboratory Applications
C. Stuart Bowyer, Editor(s)

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