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Proceedings Paper

Enhancement And Quantification Of Features In Electron Microscope Images
Author(s): Ricardo Peralta-Fabi; Esau Vicente-Vivas
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Paper Abstract

Several algorithms and devices have been developed to enhance and restore detils, as well as to quantify features in microscopic images, that have been obtained with a scanning electron microscope (SEM) from samples submitted to stress fields within the SEM. A microcomputer is used to control the scanning of the electron beam and to acquire and digitize images for processing. By the use of both, software and hardware manipulation it is possible to observe and quantify microdisplacements of the elements of a composite material, in order to advance the understanding of their behaviour in the elastic and plastic regimes, as well as to characterize their fracture modes.

Paper Details

Date Published: 18 January 1988
PDF: 4 pages
Proc. SPIE 0829, Applications of Digital Image Processing X, (18 January 1988); doi: 10.1117/12.942126
Show Author Affiliations
Ricardo Peralta-Fabi, Universidad Nacional Autonoma de Mexico (Mexico)
Esau Vicente-Vivas, Universidad Nacional Autonoma de Mexico (Mexico)

Published in SPIE Proceedings Vol. 0829:
Applications of Digital Image Processing X
Andrew G. Tescher, Editor(s)

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