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Proceedings Paper

Modeling And Correcting Scattering In Industrial Applications Of Computerized Tomography
Author(s): R.Joseph Straining; Ikram Abdou
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Paper Abstract

The Compton effect is an elastic collision between gamma and Xrays and electrons, and in tomographic imaging systems can produce spectral artifacts and distort the signals received through one or more scattering steps. In most tomography systems, energy sensitive detectors or collimation can be used to diminish the effects of Compton scattering. However, in fourth generation tomography systems, it is difficult to utilize collimators due to the fact that detectors receive signals from more than one direction. As a result, in those cases where collimation and energy sensitive detectors are not employed, there is a need to find other methods that reduce the distortion due to scatter. We developed a model for the distribution of Compton scattered photons for industrial applications by implementing a Monte Carlo simulation routine based on a single beam scanner geometry, and compared the results to expermental data collected from a single beam system at Bethlehem Steel Corporation. Significant differences appeared between the experimental and simulated data. In addition, existing scatter correction techniques were applied to data obtained from Bethlehem Steel's fourth generation tomographic system. The existing scatter correction techniques involve both point-wise and convolution models which are subtracted from the measured data to correct for scatter. Improved results were obtained in both image quality and dimensional measures. Finally, using the model of scattering obtained from the simulation data, we proposed further modification to the existing point-wise scatter correction technique, which further correct for scatter in computerized tomographic systems.

Paper Details

Date Published: 18 January 1988
PDF: 8 pages
Proc. SPIE 0829, Applications of Digital Image Processing X, (18 January 1988); doi: 10.1117/12.942124
Show Author Affiliations
R.Joseph Straining, University of Delaware (United States)
Ikram Abdou, University of Delaware (United States)

Published in SPIE Proceedings Vol. 0829:
Applications of Digital Image Processing X
Andrew G. Tescher, Editor(s)

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