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Proceedings Paper

Raman Spectroscopy Applied To The Characterization Of Semiconductors And Semiconductor Microstructures
Author(s): M. Cardona
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Paper Abstract

The inelastic scattering of light was discovered by Ramanl and, independently, by Landsberg and Madelstam2 after theoretical predictions by Brillouin3 and Smekal. Today, we call Brillouinscattering the scattering of light by long wavelength acoustic phonons (frequency < 10 cm-1) while the term "Raman" is reserved for scattering by optical phonons or by a number of other elementary excitations (magnons, plasmons,electron-hole excitations, polaritons ...) with typical frequencies between 10 and 5000 cm-1.

Paper Details

Date Published: 19 January 1988
PDF: 14 pages
Proc. SPIE 0822, Raman and Luminescence Spectroscopy in Technology, (19 January 1988); doi: 10.1117/12.941927
Show Author Affiliations
M. Cardona, Max-Planck-Institut fur Festkorperforschung (Germany)

Published in SPIE Proceedings Vol. 0822:
Raman and Luminescence Spectroscopy in Technology
Fran Adar; James E. Griffiths, Editor(s)

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