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Proceedings Paper

Ellipsometric Study Of ZnO/Ag/ZnO Optical Coatings: Determination Of Layer Thicknesses And Optical Constants
Author(s): K. Memarzadeh; J. A. Woollam; A. Belkind
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Paper Abstract

Variable angle of incidence spectroscopic ellipsometry was used to study the ZnO/Ag/ZnO (dielectric-metal-dielectric) optical coatings. As a result, the three layer thicknesses, the optical constants of the ZnO layers (3000-8000 W), and the optical constants of the Ag layers (3500-8000 Å) measured on three coated glass samples are reported here. The thickness measurements obtained by ellipsometry agreed with those determined from cross sectional TEM photos well within the error margins of the two techniques. In addition, the spectral dependence of the index of refraction of the silver layers were characterized by oscillations absent in the bulk silver optical data, and likely due to the generation of surface and bulk plasmons.

Paper Details

Date Published: 12 November 1987
PDF: 10 pages
Proc. SPIE 0823, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VI, (12 November 1987); doi: 10.1117/12.941868
Show Author Affiliations
K. Memarzadeh, University of Nebraskaâ€"Lincoln (United States)
J. A. Woollam, University of Nebraskaâ€"Lincoln (United States)
A. Belkind, BOC Group Technical Center (United States)

Published in SPIE Proceedings Vol. 0823:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion VI
Carl M. Lampert, Editor(s)

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