Share Email Print
cover

Proceedings Paper

Simulation Of The Layer-Growth Dynamics In Silver Films: Dynamics Of Adatom And Vacancy Clusters On Ag(100)
Author(s): Arthur F. Voter
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Simulation results are presented for some dynamical processes occurring in the growth of (100) layers of silver. The overlayer dynamics are evolved using a recently developed method that, in the regime where surface diffusion consists of discrete hops, yields classically exact dynamics for an arbitrary interatomic potential. The time-scale limitations of direct molecular dynamics simulations are thus overcome. The Ag/Ag(100) system is modeled using a sophisticated form of interaction potential, similar to the embedded atom method, in which the energy is given by a sum of pairwise interactions plus a term for each atom that depends on the local atomic density. This type of potential includes the many-body terms necessary to describe a variety of atomic environments, such as the perfect fcc metal, free surfaces, vacancies, interstitials, and even the diatomic molecule, but with the computational scaling of a simple pair potential. The present study focuses on some of the dynamics in a single layer of silver: the diffusion and dissociation of clusters of adatoms and vacancies. Some interesting features are observed, including a nonmonotonic decrease in diffusion constant with increasing cluster size, and a roughly constant mean square distance a cluster migrates before dissociation (ejection of a monomer).

Paper Details

Date Published: 2 February 1988
PDF: 13 pages
Proc. SPIE 0821, Modeling of Optical Thin Films, (2 February 1988); doi: 10.1117/12.941860
Show Author Affiliations
Arthur F. Voter, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0821:
Modeling of Optical Thin Films
Michael Ray Jacobson, Editor(s)

© SPIE. Terms of Use
Back to Top