Share Email Print
cover

Proceedings Paper

Development Of IR Graded Index Elements
Author(s): A. Bornstein; T. Tsalach; E. Elyasaf; Y. Atiya
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Graded Index material (GRIN) is presently being used as a flexible means of problem solving in special visual optics applications. For the optical designer GRIN serves as a novel additional design parameter whose actual employment is limited only by the ability to produce the required index profile. The most widely used commercially available GRIN material for the visible region is known under the name of selfoc, a proprietary process of a Japanese firm. The high cost of IR transmitting materials and the complex process of aspheric element fabrication suggest that IR GRIN be used as a flexible and cheaper implementation alternative. So far, nothing but theoretical work has been carried out concerning the use of GRIN elements in the IR region. To facilitate GRIN elements, three basic capabilities are required: GRIN fabrication Index profile measurement Utilization of GRIN in the optical design An original method for the fabrication of graded index elements from IR transmitting chalcogenide glasses of different compositions has been developed. The preparation method and some application of IR GRIN glasses are presented. A sample IR system employing GRIN element will be presented as well. There should be few words on the glass employed. The compositions and profiles were measured by the EDAX technique, radioactive tracing and optical methods. The diffusion parameters were calculated for Se in As2Se3 glass and are the following: Diffusion coefficient Do = 3.65 10-6cm2/sec. Activation energy Q = 3.95 k.cal/mol degree. The results will be discussed.

Paper Details

Date Published: 10 November 1987
PDF: 7 pages
Proc. SPIE 0819, Infrared Technology XIII, (10 November 1987); doi: 10.1117/12.941812
Show Author Affiliations
A. Bornstein, Soreq Nuclear Research Center (Israel)
T. Tsalach, Soreq Nuclear Research Center (Israel)
E. Elyasaf, ELOP Electrooptical Ind. Ltd. (Israel)
Y. Atiya, ELOP Electrooptical Ind. Ltd. (Israel)


Published in SPIE Proceedings Vol. 0819:
Infrared Technology XIII
Irving J. Spiro, Editor(s)

© SPIE. Terms of Use
Back to Top