Share Email Print
cover

Proceedings Paper

Absolute Distance Interferometry
Author(s): N. A. Massie; H.John Caulfield
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Measurements of distance obtained interferometrically are modulo(X) but can be made with accuracy of a fraction of the wavelength of the light used. Various techniques have been developed to overcome this limitation and obtain an absolute distance measurement with interferometric accuracy. To accomplish this, it is necessary to make measurements with more than one wavelength. The basic principles of absolute distance interferometry are discussed and the current state of the technology is reviewed.

Paper Details

Date Published: 23 March 1987
PDF: 9 pages
Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); doi: 10.1117/12.941763
Show Author Affiliations
N. A. Massie, Lawrence Livermore National Laboratory (United States)
H.John Caulfield, University of Alabama (United States)


Published in SPIE Proceedings Vol. 0816:
Interferometric Metrology
Norbert A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top